Dr. Franz Sischka studied communication engineering at the University of Stuttgart, Germany, where he received his Diplom-Ingenieur and Ph.D. degrees in 1979 and 1984. He joined Hewlett-Packard in Boeblingen/Germany, working in R&D in the fiber optics group. Since 1989, he became a consultant for Hewlett-Packard's, later Agilent-EEsof's device modeling software IC-CAP. During that time, he has focused on developing strategies for verified, reliable device measurements and also worked on modeling strategies for diodes, bipolar and GaAs transistors, as well as for passive components like spiral inductors, varactors etc.

He is the author of Agilent's (now Keysight's) IC-CAP Modeling Handbook.

In 2013, he founded the engineering office SisConsult, to share his experience with the device modeling community.

For more information, please visit www.SisConsult.de