Thomas Zimmer received the M.Sc. degree in physics from the University of Würzburg, Germany, in 1989 and the Ph.D. degree in electronics from the University Bordeaux 1, Talence, France, in 1992. From 1989 to 1990, he was with the Fraunhofer Institute, Erlangen, Germany. Since 1992, he is with the IMS Institute, Talence, France. Since 2003, he is Full Professor at the University Bordeaux. His research interests are focused on electrical compact modeling and characterization of HF devices such as HBT (SiGe, InP), graphene nanotubes and Graphene transistors. At the IMS lab, he is the pilot of the central research activities for IoT. He is a cofounder of the company XMOD Technologies and Senior Member IEEE. He has served as a Reviewer for many journals (IEEE ED, EDL, SSE…), was the TPC (Technical Program Chair) of the ESSDERC 2012 conference and participated on the Program Committee of several conferences (BCTM, ESSDERC, EuMW, IMCL …). He organized several workshops dedicated to SiGe-THz technologies, devices and systems. He served as Guest Editor for the Journal of Online Engineering (iJOE), the International Journal of Interactive Mobile Technologies (iJIM) and for Solid State Electronics (SSE). He has authored or co-authored more than 250 peer-reviewed scientific articles, two books and contributed to 8 book-chapters. He currently holds four patents.