Successful and Verified RF Measurements for Device Modeling (14th. June, 2018) |
TIME | TOPIC | |
9:00 | Impedance Measurements | |
Impedance Measurements - the Smart Enhancement for CV Meas. | ||
Interpreting Impedance Measurements | ||
Distortion by Connectors and Cables in Measurement Setup | ||
CV Measurements - a Special Case of Impedance Measurements | ||
Example: Diode Impedance Modeling | ||
10:15-10:30 | BREAK | |
10:30 | S-Parameter Measurements | |
S-Parameter Basics for Device Modeling Engineers | ||
Calculating Device Characteristics from S-Parameters | ||
Overdriven Spar | ||
TwoPort Matrix Definitions and Application of Matrix Elements | ||
Matrix Conversions N-Port | ||
11:30 | LUNCH | |
13:00 | S-Parameter Measurements (cont'd) | |
Calculating Branch-to-Branch Impedances of Multi-Ports | ||
TwoPort Matrices of Basic Schematics (TEE, PI etc.) | ||
De-Embedding | ||
Successful S-Parameter Measurements and their Verif. VIDEO | ||
Successful S-Parameter Measurements and their Verification step-by-step | ||
14:30-14:45 | BREAK | |
14:45 | Large-Signal RF Measurements | |
Successful Nonlinear-RF Measurements | ||
NVNA Measurement Principle - NVNA Calibration - NVNA Measurement Quality Verification - The NVNA Measurement Result: Magnitude and Phase of Harmonics - Synchronizing NVNA Measurement Results with Harmonic Balance Simulation Results - Device Modeling Opportunities Data Verification | ||
16:15 | Q&A |
Dr.-Ing. Franz Sischka,
in the Boeblingen Instruments Division, fiber optics group.
From 1989 to 2012, he worked as consultant for HP/Agilent-EEsof's device modeling
software IC-CAP. During that time, he has developed several modeling strategies for diodes, bipolar and GaAs/GaN transistors, as well as for passive components like spiral inductors,capacitors, and also methods to verify the measurement quality before applying device modeling. During this time, he has organized over10 IC-CAP User Meetings in Europe, and is the author of a big part of the examples directory in the Agilent/Keysight IC-CAP software. He also developed and lectured the IC- CAP Learning Week workshops in Europe, and is the author of Agilent's (now Keysight) ICCAP Modeling Handbook