Specifications
► Intelligent software
♦ Critical smith chart area determination
♦ Advanced convergence approaches (critical chart area avoided)
♦ Device safety
♦ Batch available (autonomous system)
– S parameters, I=f(V)
– Pout=f(Pin) @ ΓL(F0,2/3F0) constant
– Circle @ Pinj=cst, ΓL(F0) constant or Pinj, ΓL(2/3F0) constant
► Ultra wide band test set module (GPIB)
♦ Bandwidth @ f0: 1-40GHz
♦ Bandwidth @ f0 with matching @ 2f0: 2-18GHz
♦ CW or pulsed condition
– Pulse width min<1µs, Duty Cycle min<1%
♦ Max power handling in CW : 20W up to 18GHz, 10W > 26GHz
♦ Max power handling in pulsed condition depends on duty cycle :
– Ex: > 100W for duty cycle = 10% and PW=100µs
► Vector measurements of S11’, S21’, GL(@ f0and 2f0)
► Currents, voltages, injected input power measured
► GP, PAE, POUT, PE, Pabs calculated from measurements
► Very good accuracy thanks to a full vector calibration
► Reduction of DUT instability at low frequency
► No variation of the load @ F0 by adjusting the load @ 2f0
► For transistors FET or HBT in fixture or under RF probes
► No Matching limitation :
♦ Up to 18GHz @ Poutmax= 10W
♦ Up to 26GHz @ Poutmax= 4W
♦ Up to 40GHz @ Poutmax= 1W