III-V &SiGe device measurement :
Measurement accuracy will be with strong impact on the final model development, therefore, it is very important. For III-V devices, first of all, it is related to calibration, test bench setup....The deembedding structure must be with reasonable layout in order to get clear measurement result.
III-V & SiGe device modeling :
III-V device reliability :
III-V & SiGe device reliability :
III-V based technologies are promising in terms of electrical performances for power and high frequencies applications and their reliability assessment remains a burning issue.
